Narrow search
Showing 1 - 10 of 18
Cover Image
Optimization of a multi-response problem in Taguchi's dynamic system
Hsieh, Kun-Lin; Tong, Lee-Ing; Chiu, Hung-Pin; Yeh, Hsin-Ya - In: Computers & industrial engineering : CAIE ; an … 49 (2005) 4, pp. 556-571
Persistent link: https://www.econbiz.de/10005919981
Cover Image
Dynamic multiple responses by ideal solution analysis
Tong, Lee-Ing; Wang, Chung-Ho; Chen, Chih-Chien; Chen, … - In: European journal of operational research : EJOR 156 (2004) 2, pp. 433-444
Persistent link: https://www.econbiz.de/10006647902
Cover Image
F INFORMATION COMMERCE & TECHNOLOGY - A novel means of applying neural networks to optimize the Fb:000 multiresponse problem
Tong, Lee-Ing; Hsieh, Kun-Lin - In: Operations research, Management science : OR MS ; the … 41 (2001) 5, pp. 581-582
Persistent link: https://www.econbiz.de/10006511287
Cover Image
Bi-criteria minimization for the permutation flowshop scheduling problem with machine-based learning effects
Chung, Yu-Hsiang; Tong, Lee-Ing - In: Computers & industrial engineering : CAIE ; an … 63 (2012) 1, pp. 302-313
Persistent link: https://www.econbiz.de/10009972259
Cover Image
The Vioxx recall case and comments
Tong, Carl H.; Tong, Lee-ing; Tong, James E. - In: Competitiveness review : an international business … 19 (2009) 2, pp. 114-118
Persistent link: https://www.econbiz.de/10009891348
Cover Image
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing; Chen, K.S.; Chen, H.T. - In: International journal of quality & reliability management 19 (2002) 6-7, pp. 812-824
Persistent link: https://www.econbiz.de/10006373618
Cover Image
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing; Chen, K.S.; Chen, H.T. - In: International journal of quality & reliability management 19 (2002) 7, pp. 812-824
Persistent link: https://www.econbiz.de/10006373837
Cover Image
Number 6 - Average type-II censoring time for two-parameter Pareto and Rayleigh distributions
Chiou, Kuo-Ching; Tong, Lee-Ing - In: International journal of quality & reliability management 18 (2001) 6-7, pp. 643-656
Persistent link: https://www.econbiz.de/10006378820
Cover Image
Lower confidence limits of process capability indices for non-normal process distributions
Tong, Lee-Ing; Chen, Jann-Pygn - In: International journal of quality & reliability management 15 (1998) 8-9, pp. 907-919
Persistent link: https://www.econbiz.de/10006391798
Cover Image
Modified process control chart in IC fabrication using clustering analysis
Tong, Lee-Ing - In: International journal of quality & reliability management 15 (1998) 6-7, pp. 582-598
Persistent link: https://www.econbiz.de/10006392240