Lemley, Mark A.; Sampat, Bhaven - In: The Review of Economics and Statistics 94 (2012) 3, pp. 817-827
In this paper, we show that there are important differences across patent examiners at the U.S. Patent and Trademark Office. We show that more experienced examiners cite less prior art, are more likely to grant patents, and are more likely to grant patents without any rejections. These results...