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Can post-grant reviews improve patent system design? : a twin study of US and European patents

Graham, Stuart J. H.; Harhoff, Dietmar - 2006

Persistent link: https://www.econbiz.de/10003330744

Post-issue patent 'quality control' : a comparative study of US patent re-examinations and European patent oppositions

Graham, Erik J. H.; Hall, Bronwyn H.; Harhoff, Dietmar; … - 2002

Persistent link: https://www.econbiz.de/10001744252

Corporate R&D and productivity in Germany and the United Kingdom

Bond, Steve (contributor); Harhoff, Dietmar (contributor); … - 2003 - [Elektronische Ressource]

Persistent link: https://www.econbiz.de/10001911711

Post-issue patent "quality control" : a comparative study of US patent re-examinations and European patent oppositions

Graham, Stuart J. H.; Hall, Bronwyn H.; Harhoff, Dietmar; … - 2002

Persistent link: https://www.econbiz.de/10001652116

Can post-grant reviews improve patent system design? : a twin study of US and European patents

Graham, Stuart J. H.; Harhoff, Dietmar - 2006

This paper assesses the impact of adopting a post-grant review institution in the US patent system by comparing the 'opposition careers' of European Patent Office (EPO) equivalents of litigated US patents to those of a control group of EPO patents. We demonstrate several novel methods of...

Persistent link: https://www.econbiz.de/10010366523