Narrow search
Showing 1 - 3 of 3
Cover Image
A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
Chien, Chen-fu; Hsu, Shao-chung; Chen, Ying-jen - In: International journal of production research 51 (2013) 8, pp. 2324-2338
Persistent link: https://www.econbiz.de/10009731376
Cover Image
A hybrid approach of data mining and genetic algorithms for rehabilitation scheduling
Chien, Chen-fu; Huang, Yi-chao; Hu, Chih-han - In: International journal of manufacturing technology and … 16 (2009) 1/2, pp. 76-100
Persistent link: https://www.econbiz.de/10003829915
Cover Image
Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement
Chien, Chen-Fu; Liu, Chiao-Wen; Chuang, Shih-Chung - In: International journal of production research 55 (2017) 17/18, pp. 5095-5107
Persistent link: https://www.econbiz.de/10011723925