Kobeleva, S.P.; Sergeeva, T.G.; Leiferov, B.M.; … - In: Physica A: Statistical Mechanics and its Applications 241 (1997) 1, pp. 398-402
The chemical structure and luminescence properties of porous silicon (PS) were investigated by X-ray photoelectron (XPS) and photoluminescence (PL) spectroscopy. All of the as-anodized samples have two components of Si2p XPS spectra. Several models have been proposed to describe the large...
