Narrow search
Showing 1 - 10 of 25
Cover Image
Modelling and analysis of semiconductor manufacturing in a shrinking world : challenges and successes
Chien, Chen-fu; Dauzère-Péres, Stéphane; Ehm, Hans; … - In: European journal of industrial engineering : EJIE 5 (2011) 3, pp. 254-271
Persistent link: https://www.econbiz.de/10009425707
Cover Image
A two-phase iterative heuristic approach for the production routing problem
Absi, N.; Archetti, C.; Dauzère-Péres, Stéphane; … - In: Transportation science : a journal of the Institute for … 49 (2015) 4, pp. 784-795
Persistent link: https://www.econbiz.de/10011397878
Cover Image
A Lagrangian heuristic for an integrated lot-sizing and fixed scheduling problem
Wolosewicz, Cathy; Dauzère-Péres, Stéphane; Aggoune, Riad - In: European journal of operational research : EJOR 244 (2015) 1, pp. 3-12
Persistent link: https://www.econbiz.de/10010531996
Cover Image
A Lagrangian heuristic for capacitated single item lot sizing problems
Brahimi, Nadjib; Dauzère-Péres, Stéphane - In: 4OR : a quarterly journal of operations research 13 (2015) 2, pp. 173-198
Persistent link: https://www.econbiz.de/10011283680
Cover Image
A memetic algorithm to solve an unrelated parallel machine scheduling problem with auxiliary resources in semiconductor manufacturing
Bitar, Abdoul; Dauzère-Péres, Stéphane; Yugma, Claude; … - In: Journal of scheduling 19 (2016) 4, pp. 367-376
Persistent link: https://www.econbiz.de/10011542057
Cover Image
Integration of scheduling and advanced process control in semiconductor manufacturing : review and outlook
Yugma, Claude; Blue, Jakey; Dauzère-Péres, Stéphane; … - In: Journal of scheduling 18 (2015) 2, pp. 195-205
Persistent link: https://www.econbiz.de/10010504093
Cover Image
Optimized allocation of defect inspection capacity with a dynamic sampling strategy
Rodriguez-Verjan, Gloria Luz; Dauzère-Péres, Stéphane; … - In: Computers & operations research : and their … 53 (2015), pp. 319-327
Persistent link: https://www.econbiz.de/10010493470
Cover Image
A batching and scheduling algorithm for the diffusion area in semiconductor manufacturing
Yugma, Claude; Dauzère-Péres, Stéphane; Artigues, … - In: International journal of production research 50 (2012) 8, pp. 2118-2132
Persistent link: https://www.econbiz.de/10009563742
Cover Image
Capacitated qualification management in semiconductor manufacturing
Rowshannahad, Mehdi; Dauzère-Péres, Stéphane; … - In: Omega : the international journal of management science 54 (2015), pp. 50-59
Persistent link: https://www.econbiz.de/10011293582
Cover Image
Motivations and analysis of the capacitated lot-sizing problem with setup times and minimum and maximum ending inventories
Charles, Mehdi; Dauzère-Péres, Stéphane; … - In: European journal of operational research : EJOR 302 (2022) 1, pp. 203-220
Persistent link: https://www.econbiz.de/10013269356