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A new lot sentencing approach by variables inspection based on process yield

Wu, Chien-wei; Liu, Shih-Wen - In: International journal of production research 56 (2018) 12, pp. 4087-4099

Persistent link: https://www.econbiz.de/10011901417

Statistical Performance of Control Charts

Govindaraju, K. - In: Stochastics and Quality Control 20 (2005) 1, pp. 5-20

Abstract Average run length is the most popular measure to assess the statistical performance of a control chart procedure. This paper discusses the limitations of the traditional average run length measure and introduces the concept of ‘unity’ average run length which is the ratio of the...

Persistent link: https://www.econbiz.de/10014590799

Developing a variables repetitive group sampling scheme by considering process yield and quality loss

Wu, Chien-wei; Wu, Tai-hsi; Chen, Tiffany - In: International journal of production research 53 (2015) 7, pp. 2239-2251

Persistent link: https://www.econbiz.de/10010514650

Proposal of variable sequential sampling plan having desired operating characteristics indexed by quality loss

Tomohiro, Ryosuke; Arizono, Ikuo; Takemoto, Yasuhiko - In: International journal of production research 54 (2016) 19/20, pp. 5742-5760

Persistent link: https://www.econbiz.de/10011543319

Designing a yield-based skip-lot sampling plan for lot acceptance determination

Wu, Chien-wei; Chen, Jr-Tzung; Liu, Shih-Wen - In: Journal of the Operational Research Society 73 (2022) 3, pp. 653-663

Persistent link: https://www.econbiz.de/10013170170

A variable-type skip-lot sampling plan for products with a unilateral specification limit

Wu, Chien-wei; Lee, Amy H. I.; Huang, Yi-San - In: International journal of production research 59 (2021) 14, pp. 4140-4156

Persistent link: https://www.econbiz.de/10012589275

A modified sampling plan by variables with an adjustable mechanism for lot sentencing

Wu, Chien-wei; Chen, Jr-Tzung - In: Journal of the Operational Research Society 72 (2021) 3, pp. 678-687

Persistent link: https://www.econbiz.de/10012500980

Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan

Wu, Chien-wei; Lee, Amy H. I.; Huang, Yi-San - In: International journal of production research 60 (2022) 10, pp. 3018-3030

Persistent link: https://www.econbiz.de/10013499072

Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index Cpk

Wu, Chien-wei; Darmawan, Armin; Liu, Shih-Wen - In: International journal of production research 61 (2023) 10, pp. 3171-3183

Persistent link: https://www.econbiz.de/10014323596

Designing of a variables two-plan system by minimizing the average sample number

Balamurali, S.; Jun, Chi-Hyuck - In: Journal of Applied Statistics 36 (2009) 10, pp. 1159-1172

This article proposes a variables two-plan sampling system called tightened-normal-tightened (TNT) sampling inspection scheme where the quality characteristic follows a normal distribution or a lognormal distribution and has an upper or a lower specification limit. The TNT variables sampling...

Persistent link: https://www.econbiz.de/10008466716