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Designing a variables two-plan sampling system of type TNTVSS-(nT, nN; k) for controlling process fraction nonconforming with unilateral specification limit
Kurniati, Nani; Yeh, Ruey Huei; Wu, Chien-wei - In: International journal of production research 53 (2015) 7, pp. 2011-2025
Persistent link: https://www.econbiz.de/10010510159
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Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss
Wu, Chien-wei; Wang, Zih-Huei - In: International journal of production research 55 (2017) 7/8, pp. 2351-2364
Persistent link: https://www.econbiz.de/10011648606
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Design and construction of a variables multiple dependent state sampling plan based on process yield
Wu, Chien-wei; Liu, Shih-Wen; Lee, Amy H. I. - In: European journal of industrial engineering : EJIE 9 (2015) 6, pp. 819-838
Persistent link: https://www.econbiz.de/10011603985
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A new lot sentencing approach by variables inspection based on process yield
Wu, Chien-wei; Liu, Shih-Wen - In: International journal of production research 56 (2018) 12, pp. 4087-4099
Persistent link: https://www.econbiz.de/10011901417