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An AHP-based approach to ERP system selection
Wei, Chun-Chin; Chien, Chen-Fu; Wang, Mao-Jiun J. - In: International journal of production economics 96 (2005) 1, pp. 47-62
Persistent link: https://www.econbiz.de/10006230252
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Manufacturing intelligence for semiconductor demand forecast based on technology diffusion and product life cycle
Chien, Chen-Fu; Chen, Yun-Ju; Peng, Jin-Tang - In: International journal of production economics 128 (2010) 2, pp. 496-510
Persistent link: https://www.econbiz.de/10008715786
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Requirement estimation for indirect workforce allocation in semiconductor manufacturing
Chien, Chen-Fu; Chen, Wen-Chih; Hsu, Shao-Chung - In: International journal of production research : American … 48 (2010) 23, pp. 6959-6977
Persistent link: https://www.econbiz.de/10008720532
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Made in Taiwan - Shifting paradigms in high-tech industries
Chien, Chen-Fu - In: Industrial engineer : IE ; engineering & management … 39 (2007) 2, pp. 47-49
Persistent link: https://www.econbiz.de/10007608223
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Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing
Hsu, Shao-Chung; Chien, Chen-Fu - In: International journal of production economics 107 (2007) 1, pp. 88-103
Persistent link: https://www.econbiz.de/10007609413
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A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness
Chien, Chen-Fu; Wang, Hung-Ju; Wang, Min - In: International journal of production economics 107 (2007) 1, pp. 20-30
Persistent link: https://www.econbiz.de/10007609418
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Data mining for improving the solder bumping process in the semiconductor packaging industry
Chien, Chen-fu; Li, Huan-chung; Jeang, Angus - In: International journal of intelligent systems in … 14 (2006) 1, pp. 43-58
Persistent link: https://www.econbiz.de/10007592753
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Constructing the OGE for promoting tool group productivity in semiconductor manufacturing
Chien, Chen-Fu; Chen, Hsin-Kai; Wu, Jei-Zheng; Hu, Chih-Han - In: International journal of production research : American … 45 (2007) 3, pp. 509-524
Persistent link: https://www.econbiz.de/10007597266
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A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
Chien, Chen-Fu; Hsu, Shao-Chung; Chen, Ying-Jen - In: International journal of production research : American … 51 (2013) 8, pp. 2324-2338
Persistent link: https://www.econbiz.de/10010086207
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Modelling and analysis of semiconductor manufacturing in a shrinking world : challenges and successes
Chien, Chen-fu; Dauzere-Peres, Stephane; Ehm, Hans; … - In: European journal of industrial engineering : EJIE 5 (2011) 3, pp. 254-271
Persistent link: https://www.econbiz.de/10009882597