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Systems and Networks - A Genetic Algorithm for Reliability-Oriented Task Assignment With k Duplications in Distributed Systems
Chiu, C.-C.; Hsu, C.-H.; Yeh, Y.-S. - In: IEEE transactions on reliability : R ; IEEE T R 55 (2006) 1, pp. 105-117
Persistent link: https://www.econbiz.de/10006604383
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Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning
Chen, Argon; Hsu, C.-H.; Blue, J. - In: International journal of production research : American … 45 (2007) 10, pp. 2269-2294
Persistent link: https://www.econbiz.de/10007732219
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Circuits - Fault Tolerance Techniques for High Capacity RAM
Lu, S.-K.; Hsu, C.-H. - In: IEEE transactions on reliability : R ; IEEE T R 55 (2006) 2, pp. 293-306
Persistent link: https://www.econbiz.de/10007267950
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Group Technology Application for PCB Assembly
Jiang, B.C.; Lan, J. - In: International journal of industrial engineering : … 9 (2002) 4, pp. 399-407
Persistent link: https://www.econbiz.de/10005937926
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Machine vision and background remover-based approach for PCB solder joints inspection
Jiang, B.C.; Wang, C.C.; Hsu, Y.N. - In: International journal of production research : American … 45 (2007) 2, pp. 451-464
Persistent link: https://www.econbiz.de/10007597283
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General run-to-run (R2R) control framework using self-tuning control for multiple-input multiple-output (MIMO) processes
Jen, C.-H.; Jiang, B.C.; Fan, S.-K.S. - In: International journal of production research : American … 42 (2004) 20, pp. 4249-4270
Persistent link: https://www.econbiz.de/10006125033
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Bootstrap sampling technique applied to the PCB golden fingers defect classification study
Jiang, B.C.; Wang, Y.M.; Wang, C.C. - In: International journal of production research : American … 39 (2001) 10, pp. 2215-2230
Persistent link: https://www.econbiz.de/10006131431
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A methodology to evaluate-improve the performance of a machine vision system.
Shiau, Y.-R.; Jiang, B.C. - In: International journal of production research : American … 31 (1993) 6, pp. 1467-1478
Persistent link: https://www.econbiz.de/10006148348
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Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques
Jiang, B.C.; Wang, C.-C.; Liu, H.-C. - In: International journal of production research : American … 43 (2005) 1, pp. 67-80
Persistent link: https://www.econbiz.de/10006123181
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PCB Solder Joint Defects Detection and Classification Using Machine Vision
Wang, C.-C.; Jiang, B.C. - In: International journal of industrial engineering : … 8 (2001) 4, pp. 359-369
Persistent link: https://www.econbiz.de/10005945516