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Capability adjustment for gamm...
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International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
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Quality and reliability engineering international
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On the Distributional Properties of the Estimated Process Accuracy Index Ca
Lin, G.H.
;
Pearn, W.L.
- In:
International journal of industrial engineering : …
11
(
2004
)
2
,
pp. 169-177
Persistent link: https://www.econbiz.de/10005925976
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22
A Practical Implementation of the Incapability Index Cpp
Pearn, W.L.
;
Chen, K.L.
;
Chen, K.S.
- In:
International journal of industrial engineering : …
9
(
2002
)
4
,
pp. 372-383
Persistent link: https://www.econbiz.de/10005937929
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23
Variables sampling plans with PPM fraction of defectives and process loss consideration
Pearn, W.L.
;
Wu, Chien-Wei
- In:
Journal of the Operational Research Society : OR
57
(
2006
)
4
,
pp. 450-459
Persistent link: https://www.econbiz.de/10006010447
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24
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
Pearn, W.L.
;
Chung, S.H.
;
Yang, M.H.
;
Chen, Y.H.
- In:
Journal of the Operational Research Society : OR
55
(
2004
)
11
,
pp. 1194-1207
Persistent link: https://www.econbiz.de/10006020428
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25
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C pmk
Pearn, W.L.
;
Shu, M.H.
;
Hsu, B.M.
- In:
International journal of production research : American …
43
(
2005
)
12
,
pp. 2493-2512
Persistent link: https://www.econbiz.de/10006124351
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26
Quality-yield measure for production processes with very low fraction defective
Pearn, W.L.
;
Chang, Y.C.
;
Wu, Chien-Wei
- In:
International journal of production research : American …
42
(
2004
)
23
,
pp. 4909-4926
Persistent link: https://www.econbiz.de/10006125480
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27
Procedure for supplier selection based on C pm applied to super twisted nematic liquid crystal display processes
Pearn, W.L.
;
Wu, C.-W.
;
Lin, H.C.
- In:
International journal of production research : American …
42
(
2004
)
13
,
pp. 2719-2734
Persistent link: https://www.econbiz.de/10006125728
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28
Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
Pearn, W.L.
;
Shu, M.H.
;
Hsu, B.M.
- In:
International journal of production research : American …
42
(
2004
)
12
,
pp. 2339-2356
Persistent link: https://www.econbiz.de/10006125808
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29
Lower confidence bounds with sample size information for C pm applied to production yield assurance
Pearn, W.L.
;
Shu, Ming-Hung
- In:
International journal of production research : American …
41
(
2003
)
15
,
pp. 3581-3600
Persistent link: https://www.econbiz.de/10006127143
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30
Job order releasing and throughput planning for multi-priority orders in wafer fabs
Chung, S.H.
;
Pearn, W.L.
;
Lee, A.H.I.
;
Ke, W.T.
- In:
International journal of production research : American …
41
(
2003
)
8
,
pp. 1765-1784
Persistent link: https://www.econbiz.de/10006127730
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