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On the Distributional Properties of the Estimated Process Accuracy Index Ca
Lin, G.H.; Pearn, W.L. - In: International journal of industrial engineering : … 11 (2004) 2, pp. 169-177
Persistent link: https://www.econbiz.de/10005925976
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A Practical Implementation of the Incapability Index Cpp
Pearn, W.L.; Chen, K.L.; Chen, K.S. - In: International journal of industrial engineering : … 9 (2002) 4, pp. 372-383
Persistent link: https://www.econbiz.de/10005937929
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Variables sampling plans with PPM fraction of defectives and process loss consideration
Pearn, W.L.; Wu, Chien-Wei - In: Journal of the Operational Research Society : OR 57 (2006) 4, pp. 450-459
Persistent link: https://www.econbiz.de/10006010447
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Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Chen, Y.H. - In: Journal of the Operational Research Society : OR 55 (2004) 11, pp. 1194-1207
Persistent link: https://www.econbiz.de/10006020428
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Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C pmk
Pearn, W.L.; Shu, M.H.; Hsu, B.M. - In: International journal of production research : American … 43 (2005) 12, pp. 2493-2512
Persistent link: https://www.econbiz.de/10006124351
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Quality-yield measure for production processes with very low fraction defective
Pearn, W.L.; Chang, Y.C.; Wu, Chien-Wei - In: International journal of production research : American … 42 (2004) 23, pp. 4909-4926
Persistent link: https://www.econbiz.de/10006125480
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Procedure for supplier selection based on C pm applied to super twisted nematic liquid crystal display processes
Pearn, W.L.; Wu, C.-W.; Lin, H.C. - In: International journal of production research : American … 42 (2004) 13, pp. 2719-2734
Persistent link: https://www.econbiz.de/10006125728
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Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
Pearn, W.L.; Shu, M.H.; Hsu, B.M. - In: International journal of production research : American … 42 (2004) 12, pp. 2339-2356
Persistent link: https://www.econbiz.de/10006125808
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Lower confidence bounds with sample size information for C pm applied to production yield assurance
Pearn, W.L.; Shu, Ming-Hung - In: International journal of production research : American … 41 (2003) 15, pp. 3581-3600
Persistent link: https://www.econbiz.de/10006127143
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Job order releasing and throughput planning for multi-priority orders in wafer fabs
Chung, S.H.; Pearn, W.L.; Lee, A.H.I.; Ke, W.T. - In: International journal of production research : American … 41 (2003) 8, pp. 1765-1784
Persistent link: https://www.econbiz.de/10006127730