Balakrishnan, N.; Kamps, U.; Kateri, M. - In: Statistics & Probability Letters 79 (2009) 13, pp. 1548-1558
In the one- and multi-sample cases, in the context of life-testing reliability experiments, we introduce minimal repair processes under a simple step-stress test, based on exponential distributions and an associated cumulative exposure model, and then develop likelihood inference for such a model.