Benchmarking of patents: An application of GAM methodology

The present article reexamines some of the issues regarding the benchmarking of patents using the NBER data base on U.S. patents by generalizing a parametric citation model and by estimating it using GAM methodology. The main conclusion is that the estimated effects differ considerably from sector to sector, and the differences can be estimated nonparametrically but not by the parametric dummy variable approach.

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Year of publication:	2007-04
Authors:	Mariel Chladkova, Petr ; Orbe Mandaluniz, Susan
Institutions:	Departamento de Economía Aplicada III (Econometría y Estadística), Facultad de Ciencias Económicas y Empresariales
Subject:	USPTO \| patent benchmarking \| GAM

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Extent:	application/pdf
Series:	BILTOKI.
Type of publication:	Book / Working Paper
Notes:	The text is part of a series Biltoki 2007.02 Number 2007-02
Classification:	O3 - Technological Change; Research and Development ; C14 - Semiparametric and Nonparametric Methods
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10005518737