Cumulative conformance count charts with variable sampling intervals for correlated samples
Year of publication: |
2013
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---|---|
Authors: | Chen, Yan-Kwang |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 64.2013, 1, p. 302-308
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Saved in:
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