Explaining resistance to system usage in the PharmaCloud : a view of the dual-factor model
Year of publication: |
January 2018
|
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Authors: | Hsieh, Pi-Jung ; Lin, Weir-Sen |
Published in: |
Information & management : the internat. journal of management processes and systems ; journal of IFIP Users Group. - Amsterdam : Elsevier, ISSN 0378-7206, ZDB-ID 432134-0. - Vol. 55.2018, 1, p. 51-63
|
Subject: | PharmaCloud | Drug safety | User resistance | System use | Status quo bias |
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