How to measure patent thickets : a novel approach

Georg von Graevenitz, Stefan Wagner and Dietmar Harhoff

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

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Year of publication:	2009
Authors:	Graevenitz, Georg von ; Wagner, Stefan ; Harhoff, Dietmar
Publisher:	München : Fakultät für Betriebswirtschaft, Ludwig-Maximilians-Universität München
Subject:	patenting \| patent thickets \| patent portfolio races \| complexity \| Patent \| Komplexe Systeme \| Complex systems \| Bibliometrie \| Bibliometrics \| Algorithmus \| Algorithm

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Extent:	Online-Ressource (10 S.)
Series:	Münchener Wirtschaftswissenschaftliche Beiträge : BWL ; discussion paper. - München : Univ., ZDB-ID 2363772-9.
Type of publication:	Book / Working Paper
Type of publication (narrower categories):	Arbeitspapier ; Working Paper ; Graue Literatur ; Non-commercial literature
Language:	English
Notes:	Systemvoraussetzungen: Acrobat reader
Other identifiers:	hdl:10419/104508 [Handle]
Classification:	L13 - Oligopoly and Other Imperfect Markets ; L20 - Firm Objectives, Organization, and Behavior. General ; O34 - Intellectual Property Rights: National and International Issues
Source:	ECONIS - Online Catalogue of the ZBW

Persistent link: https://www.econbiz.de/10003922557