How to measure patent thickets – a novel approach

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

MoreLess

Year of publication:	2009
Authors:	von Graevenitz, Georg ; Wagner, Stefan ; Harhoff, Dietmar
Publisher:	München : Ludwig-Maximilians-Universität München, Fakultät für Betriebswirtschaft
Subject:	Patent \| Komplexe Systeme \| Bibliometrie \| Algorithmus \| patenting \| patent thickets \| patent portfolio races \| complexity

freely available

Full text |

More access options

doi.org

Check Google Scholar

In German libraries (KVK)

I need help

More details

Series:	Discussion Paper ; 2009-09
Type of publication:	Book / Working Paper
Type of publication (narrower categories):	Working Paper
Language:	English
Other identifiers:	10.5282/ubm/epub.10962 [DOI] 617050260 [GVK] hdl:10419/104508 [Handle] RePEc:lmu:msmdpa:10962 [RePEc]
Classification:	L13 - Oligopoly and Other Imperfect Markets ; L20 - Firm Objectives, Organization, and Behavior. General ; O34 - Intellectual Property Rights: National and International Issues
Source:	EconStor

Persistent link: https://www.econbiz.de/10010427770