Incidental Trends and the Power of Panel Unit Root Tests
Year of publication: |
2004-07-28
|
---|---|
Authors: | Phillips, Peter C.B. ; Moon, Hyungsik Roger ; Perron, Benoit |
Institutions: | School of Management, Yale University |
Subject: | Asymptotic power envelope | common point | optimal test | heterogeneous alternatives | incidental trends | local to unity | power function | panel unit root test |
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