Mission reliability of an automatic control system integrated with distributed intelligent built-in-test systems
Year of publication: |
1997
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Authors: | Yoo, Wang-Jin ; Jung, Kyung-Hee |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 33.1997, 3-4, p. 753-756
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