Modeling the Duration of Patent Examination at the European Patent Office
Year of publication: |
2006
|
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Authors: | Harhoff, Dietmar ; Wagner, Stefan |
Institutions: | Volkswirtschaftliche Fakultät, Ludwig-Maximilians-Universität München |
Subject: | patents | patent examination | survival analysis | patent citations | European Patent Office |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Classification: | C15 - Statistical Simulation Methods; Monte Carlo Methods ; C41 - Duration Analysis ; D73 - Bureaucracy; Administrative Processes in Public Organizations; Corruption |
Source: |
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Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
-
Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
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Modeling the duration of patent examination at the European Patent Office
Harhoff, Dietmar, (2006)
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Incidence and Growth of Patent Thickets - The Impact of Technological Opportunities and Complexity
Graevenitz, Georg von, (2011)
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Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
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How to measure patent thickets – a novel approach
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