Modelling the duration of patent examination at the European Patent Office
Year of publication: |
2005-10
|
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Authors: | Harhoff, Dietmar ; Wagner, Stefan |
Institutions: | C.E.P.R. Discussion Papers |
Subject: | European Patent Office | patent examination | patents | survival analysis |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Notes: | Number 5283 |
Classification: | C15 - Statistical Simulation Methods; Monte Carlo Methods ; C41 - Duration Analysis ; D73 - Bureaucracy; Administrative Processes in Public Organizations; Corruption ; O34 - Intellectual Property Rights: National and International Issues |
Source: |
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Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
-
Modeling the duration of patent examination at the European Patent Office
Harhoff, Dietmar, (2006)
-
Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
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Incidence and Growth of Patent Thickets - The Impact of Technological Opportunities and Complexity
Harhoff, Dietmar, (2008)
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Conflict Resolution, Public Goods and Patent Thickets
Harhoff, Dietmar, (2013)
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Incidence and Growth of Patent Thickets - The Impact of Technological Opportunities and Complexity
von Graevenitz, Georg, (2011)
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