Patent examination at the State Intellectual Property Office in China
Year of publication: |
2013
|
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Authors: | Liegsalz, Johannes ; Wagner, Stefan |
Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 42.2013, 2, p. 552-563
|
Subject: | Patent examination | Duration | State intellectual Property Office (SIPO) | China | Immaterialgüterrechte | Intellectual property rights | Patent |
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