Technology trajectories and the selection of optimal R&D project sequences
Year of publication: |
2014
|
---|---|
Authors: | Bommel, Ties van ; Mahieu, Ronald J. ; Nijssen, E. J. |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 61.2014, 4, p. 669-680
|
Subject: | Affordable loss | capability | development | interproject learning | managing R&D projects | real options | sensitivity analyses | technology trajectory | Projektmanagement | Project management | Realoptionsansatz | Real options analysis |
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