The impact of clustered defect distributions in IC fabrication
Year of publication: |
1989
|
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Authors: | Albin, Susan L. |
Other Persons: | Friedman, David J. (contributor) |
Published in: |
Management science : journal of the Institute for Operations Research and the Management Sciences. - Catonsville, MD : INFORMS, ISSN 0025-1909, ZDB-ID 206345-1. - Vol. 35.1989, 9, p. 1066-1078
|
Subject: | Neyman Distribution | Qualitätsmanagement | Quality management | Elektronik | Electronics | Wahrscheinlichkeitsrechnung | Probability theory | Theorie | Theory |
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