Search Results - subject:"X-ray photoelectron spectroscopy"

Cultural heritage materials : an XPS approach

Altavilla, Claudia; Ciliberto, Enrico - 2011

Persistent link: https://www.econbiz.de/10009497668

RF-ARGON PLASMA INDUCED SURFACE MODIFICATION OF PAPER

SAHIN, HALIL TURGUT - In: Surface Review and Letters (SRL) 15 (2008) 04, pp. 503-508

The radio frequency (RF) argon plasma induced surface modification of paper revealed novel surface characteristics and substantially changed surface topography. It was found that RF-argon glow discharge affects surface properties resulting in photo-degradation and chain-scission mechanism on...

Persistent link: https://www.econbiz.de/10005080510

STUDY OF COLORATION ON EXCIMER LASER TREATED TITANIUM SURFACES

QIAN, H. X.; ZHOU, WEI; ZHENG, H. Y. - In: Surface Review and Letters (SRL) 15 (2008) 05, pp. 675-679

by varying the number of laser pulses at the fixed laser fluence. X-ray photoelectron spectroscopy shows that the outmost …

Persistent link: https://www.econbiz.de/10005080593

HYPERBRANCHED ALIPHATIC POLYESTER MODIFIED ACTIVATED CARBON PARTICLES WITH HOMOGENIZED SURFACE GROUPS

LIU, PENG; ZHANG, LIUXUE - In: Surface Review and Letters (SRL) 14 (2007) 06, pp. 1025-1032

activated carbon particles and the graft polymerization of the hyperbranched aliphatic polyester were investigated by X-ray … photoelectron spectroscopy (XPS) technique. The products were also characterized with Fourier transform infrared (FT-IR) and …

Persistent link: https://www.econbiz.de/10005080532

PREPARATION OF INDIUM TIN OXIDE FILMS BY RADIO FREQUENCY MAGNETRON SPUTTERING UNDER LOW VACUUM LEVEL

ZHU, H. B.; LI, X. D.; HUANG, S. Y.; JIN, C. X.; SUN, Z.; … - In: Surface Review and Letters (SRL) 13 (2006) 06, pp. 833-840

electron microscope (FESEM) and an X-ray diffractometer (XRD). X-ray photoelectron spectroscopy (XPS) was performed to …

Persistent link: https://www.econbiz.de/10005080639

XPS and PL studies of porous silicon treated in water and oxygen-rich gases

Kobeleva, S.P.; Sergeeva, T.G.; Leiferov, B.M.; … - In: Physica A: Statistical Mechanics and its Applications 241 (1997) 1, pp. 398-402

The chemical structure and luminescence properties of porous silicon (PS) were investigated by X-ray photoelectron (XPS) and photoluminescence (PL) spectroscopy. All of the as-anodized samples have two components of Si2p XPS spectra. Several models have been proposed to describe the large...

Persistent link: https://www.econbiz.de/10010586897