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Hu, Chih-Han
Chien, Chen-Fu
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International journal of manufacturing technology and management
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Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework
Chien, Chen-Fu
;
Hu, Chih-Han
;
Lin, Chi-Yung
- In:
International journal of manufacturing technology and …
14
(
2008
)
1/2
,
pp. 130-144
Persistent link: https://www.econbiz.de/10003691544
Saved in:
2
Constructing the OGE for promoting tool group productivity in semiconductor manufacturing
Chien, Chen-Fu
;
Chen, Hsin-Kai
;
Wu, Jei-Zheng
;
Hu, Chih-Han
- In:
International journal of production research : American …
45
(
2007
)
3
,
pp. 509-524
Persistent link: https://www.econbiz.de/10007597266
Saved in:
3
Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework
Chien, Chen-Fu
;
Hu, Chih-Han
;
Lin, Chi-Yung
- In:
International journal of manufacturing technology and …
14
(
2008
)
1/2
,
pp. 130-144
Persistent link: https://www.econbiz.de/10009873053
Saved in:
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