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Part Manufacturer Assessment Process
Jackson, M.; Mathur, A.; Pecht, M.; Kendall, R. - In: Quality and reliability engineering international 15 (1999) 6, pp. 457-468
Persistent link: https://www.econbiz.de/10006387504
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Component Reliability and Testing - Contact Discontinuity Modeling of Electromechanical Switches
Xie, J.; Pecht, M. - In: IEEE transactions on reliability : R ; IEEE T R 53 (2004) 2, pp. 279-283
Persistent link: https://www.econbiz.de/10006609586
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Management of design activities in a concurrent engineering environment
Pourbabai, B.; Pecht, M. - In: International journal of production research : American … 32 (1994) 4, pp. 821-832
Persistent link: https://www.econbiz.de/10006146792
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COMMENTARY & PERSPECTIVE - A critique of the Reliability-Analysis-Center failure-rate-model for plastic encapsulated microciruits
Sinnadurai, N.; Shukla, A.; Pecht, M. - In: IEEE transactions on reliability : R ; IEEE T R 47 (1998) 2, pp. 110-113
Persistent link: https://www.econbiz.de/10006628251
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Why attempting to change can frustrate the most determined
Pecht, M. - In: IEEE transactions on reliability : R ; IEEE T R 45 (1996) 2, pp. 171-172
Persistent link: https://www.econbiz.de/10006633643
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Reliability evaluation of plastic-encapsulated parts
Weil, L.; Pecht, M.; Hakim, E. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 4, pp. 536-540
Persistent link: https://www.econbiz.de/10006639164
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Plastic packaged microcircuits: Quality, reliability, and cost issues
Pecht, M.; Agarwal, R.; Quearry, D. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 4, pp. 513-517
Persistent link: https://www.econbiz.de/10006639166
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An Investigation of 'Cannot Duplicate' Failures
Williams, R.; Banner, J.; Knowles, I.; Dube, M.; … - In: Quality and reliability engineering international 14 (1998) 5, pp. 331-338
Persistent link: https://www.econbiz.de/10006391741
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'Smart' Electronic Systems for Condition-based Health Management
Kelkar, N.; Dasgupta, A.; Pecht, M.; Knowles, I.; Hawley, M. - In: Quality and reliability engineering international 13 (1997) 1, pp. 3-8
Persistent link: https://www.econbiz.de/10006397189
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Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics
Patil, N.; Celaya, J.; Das, D.; Goebel, K.; Pecht, M. - In: IEEE transactions on reliability : R ; IEEE T R 58 (2009) 2, pp. 271-276
Persistent link: https://www.econbiz.de/10008278959